a Ion injection, isolation and excitation times were kept constant (50, 10 and 15 ms, respectively). b f 13 C-labelled internal standard of PCBs.
An ion beam deflector for use in the analysis of neutral products of ion fragmentations
β Scribed by John L. Holmes; Alexander A. Mommers
- Publisher
- John Wiley and Sons
- Year
- 1984
- Tongue
- English
- Weight
- 149 KB
- Volume
- 19
- Category
- Article
- ISSN
- 1076-5174
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Ion beam analysis (IBA) methods were used for the characterization of interdiffusion in thin Au-A1 multilayered systems. Conventional RBS with a high depth resolution at the specimen surface and at the interfaces (e.g. 14 nm in the depth of 255 nm) was used for gold depth profiling. In contrast to g
## Abstract Tripleβstage quadrupole (TSQ) electrospray ionization (ESI) tandem mass spectrometry (MS/MS) and ion trap ESIβMS/MS can be used to cleave protonated molecules to produce carbocations and neutral molecules in the positive ion mode. Dissociation products which correspond to protonated for
A procedure is described for the determination of three characteristic b-agonists (clenbuterol, terbutalin and salbutamol) based on the formation of the corresponding protonated molecules and related collisional experiments. Quantification was carried out on selected collisional fragments and the re