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Fast neutral beam Fourier transform ion cyclotron resonance mass spectrometry for analysis of insulating and conductive materials

✍ Scribed by Patrick A. Limbach; Hyun Sik Kim; Nicholas C. Hill; Alan G. Marshall

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
884 KB
Volume
277
Category
Article
ISSN
0003-2670

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✦ Synopsis

The use of an autoneutralizing fast neutral SF, beam (FNB) for secondary ion quadrupole mass spectrometry of refractive samples has been demonstrated previously. Here, we demonstrate the FNB technique for generation and high-resolution Fourier transform ion cyclotron resonance (FT-ICRl mass spectrometric detection of ions from a wide variety of samples. Tbe fast neutral beam generates abundant secondary ions from both conductive and insulating samples for detection in an open-ended ICR ion trap, as demonstrated by representative mass spectra of methyl stearate, fluorocarbon polymers, gramicidin S, and fullerenes. Optimization of the FNB-FT-RX-MS experiment is discussed in detail, with particular emphasis on analysis of insulating materials which are not readily analyzed by ion-bombardment secondary ion mass spectrometry.

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