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An Interferometric Method for Accurate Thickness Measurements of Thin Evaporated Films

✍ Scribed by SCHULZ, L. G.

Book ID: 115377305
Publisher: Optical Society of America
Year: 1950
Weight: 702 KB
Volume: 40
Category: Article
ISSN: 0030-3941
DOI: 10.1364/JOSA.40.000690

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