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Reliable Methods for Calculation of Average Film Thickness in a Vertical Thin-film Evaporator

✍ Scribed by Ing. Dominique A. Taeymans

Publisher: John Wiley and Sons
Year: 1979
Tongue: German
Weight: 164 KB
Volume: 51
Category: Article
ISSN: 0009-286X
DOI: 10.1002/cite.330510918

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