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Nondestructive Interferometric Thickness Measurement of Thin Transparent Films

โœ Scribed by SAUER, ROGER L.


Book ID
115378970
Publisher
Optical Society of America
Year
1958
Weight
347 KB
Volume
48
Category
Article
ISSN
0030-3941

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Laser interferometric measurement of pol
โœ Katherine L. Saenger; Ho-Ming Tong ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 428 KB ๐Ÿ‘ 3 views

A simple interferometric technique is described for monitoring thickness changes in solution-cast polymer films as they are dried and cured. This paper follows a freshly spun solution of polyamic acid in NMP as it is converted into a cured polyimide film of 6 pm in thickness. The technique is shown