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An Error Rate Based Test Methodology to Support Error-Tolerance

✍ Scribed by Tong-Yu Hsieh; Kuen-Jong Lee; Breuer, M.A.

Book ID: 114668656
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 467 KB
Volume: 57
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.2008.916875

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