An Error-Tolerance-Based Test Methodology to Support Product Grading for Yield Enhancement

✍ Scribed by Tong-Yu Hsieh; Kuen-Jong Lee; Breuer, M.A.

• Book ID: 114607584
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 214 KB
• Volume: 30
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2011.2113690