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[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - An Efficient Test Methodology for Image Processing Applications Based on Error-Tolerance

โœ Scribed by Hsieh, Tong-Yu; Peng, Yi-Han; Ku, Chia-Chi


Book ID
125490058
Publisher
IEEE
Year
2013
Weight
997 KB
Category
Article
ISBN
0769550800

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