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[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test

โœ Scribed by Fukazawa, Yuki; Iwagaki, Tsuyoshi; Ichihara, Hideyuki; Inoue, Tomoo


Book ID
125534977
Publisher
IEEE
Year
2013
Weight
360 KB
Category
Article
ISBN
0769550800

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