✦ LIBER ✦
Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-Based FPGAs
✍ Scribed by Velazco, Raoul; Foucard, Gilles; Peronnard, Paul
- Book ID
- 120543284
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 335 KB
- Category
- Article
- ISSN
- 0018-9499
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