✦ LIBER ✦

An empirical model for device degradation due to hot-carrier injection

✍ Scribed by Takeda, E.; Suzuki, N.

Book ID: 119967903
Publisher: IEEE
Year: 1983
Tongue: English
Weight: 249 KB
Volume: 4
Category: Article
ISSN: 0741-3106
DOI: 10.1109/EDL.1983.25667

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