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An analytical approach for physical modeling of hot-carrier induced degradation

โœ Scribed by S. Tyaginov; I. Starkov; H. Enichlmair; Ch. Jungemann; J.M. Park; E. Seebacher; R. Orio; H. Ceric; T. Grasser


Book ID
113800588
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
907 KB
Volume
51
Category
Article
ISSN
0026-2714

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