✦ LIBER ✦
IIIB-2 mean time to failure model for hot-carrier-induced degradation
✍ Scribed by Chen, K.L.; Saller, S.A.; Groves, I.A.; Scott, D.B.
- Book ID
- 114594976
- Publisher
- IEEE
- Year
- 1984
- Tongue
- English
- Weight
- 323 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.