Aluminum distribution in ZSM-5 as determined by X-Ray photoelectron spectroscopy
โ Scribed by A.E. Hughes; K.G. Wilshier; B.A. Sexton; P. Smart
- Book ID
- 113177247
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 970 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0021-9517
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๐ SIMILAR VOLUMES
## Silicon with thermally-grown oxide overlayers m the thickness range IS-89 A IS studied by angulardcpendent XPS. Electron attenuation lengths at 1382 eV are found to be 37 +-4 A in SiOz and 27 +-6 A in Si. Single-crystal effects and thin-layer anomalies are also discussed.
## Recciwd 4 August 197.5 Revised manuscript rcccivcd 29 Scptcmbcr 1975 The XPS spectrum of the 4fIzvels of W in N+\VOJ bronzes is explained by sssurning the prescnca of three oxidation states (WG+, Wsc nnd \V4'). Tetravslcnt tungsten is formed by dismutation of W 5+. The partial reduction of W6+
## Reacivcd 21 JFW 1976 Several iridium supported catalysts arc prcparcd from hcxachloroiridic acid and analyscd by X-ray photoelectron spctroscopy. A linear correlation is obtained with the intensity ratios of the chlorine 2p and iridium 4f tines and the atomic concentrations as dctcrmincd by che