Alignment of Gold Nanorods in Polymer Composites and on Polymer Surfaces

✍ Scribed by C. J. Murphy; C. J. Orendorff

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 316 KB
• Volume: 17
• Category: Article
• ISSN: 0935-9648
• DOI: 10.1002/adma.200501042

✦ Synopsis

Experimental

TDMEE thin films for data recording were prepared on a HOPG substrate by vacuum deposition with a deposition rate of ~5 nm min ±1 . The thickness of the thin film was about 40 nm. The base vacuum of the deposition system was about 5 10 ±6 torr (1 torr » 133 Pa), and the powder material was heated to 85 C in a crucible in the vacuum chamber. Recording experiments were carried out with an NT-MDT P47 STM under ambient conditions in constant-height mode, using tips made of tungsten wires (0.22 mm in diameter) by electrochemical etching. The recording pattern was obtained by applying voltage pulses of 2.64 V for 10 ms between the STM tip and the HOPG substrate, and the local I±V curves were obtained by scanning tunneling spectroscopy (STS). It is noted that, at the fixed pulse width of 10 ms, there exists a threshold voltage, 2.64 V, for dot formation, only above which can a dot be recorded on the film. The TEM study was conducted on an Hitachi H-8100 system. Samples for typical TEM images and selected-area electron diffraction patterns were deposited on a Cu grid with an amorphous carbon supporting film. Microreflection±absorption infrared spectra of TDMEE films deposited on an indium tin oxide (ITO)-coated quartz substrate, before and after applying an electric field, were measured with a Nicolet Magna IR 750 spectrometer.