AFM and FTIR characterization of microcrystalline Si obtained from isothermal annealing of Al/a-Si:H

✍ Scribed by Rojas-López, M. ;Orduña-Díaz, A. ;Delgado-Macuil, R. ;Olvera-Hernández, J. ;Navarro-Contreras, H. ;Vidal, M. A. ;Saucedo, N. ;Mendez-García, V. H.

• Book ID: 118285948
• Publisher: John Wiley and Sons
• Year: 2007
• Tongue: English
• Weight: 248 KB
• Volume: 204
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200674146