Stable and metastable defect distributions in undoped and doped a-Si:H obtained from analysis of the constant photocurrent method

✍ Scribed by Frank Siebke; Helmut Stiebig

• Book ID: 115990889
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 337 KB
• Volume: 198-200
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/0022-3093(95)00704-0