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Charged and neutral defect states in a-Si:H determined from improved analysis of the constant photocurrent method

✍ Scribed by F. Siebke; H. Stiebig; A. Abo-Arais; H. Wagner

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 373 KB
Volume: 41-42
Category: Article
ISSN: 0927-0248
DOI: 10.1016/0927-0248(95)00140-9

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