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Actual comparison of experimental and simulated lattice images of the GaAs/AlAs interface

✍ Scribed by A.F. de Jong; H. Bender; W. Coene


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
924 KB
Volume
21
Category
Article
ISSN
0304-3991

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X-Ray Diffraction Analysis of the In/Ga
✍ Jose Fayos; Mercedes Perez-Mendez πŸ“‚ Article πŸ“… 1993 πŸ› Elsevier Science 🌐 English βš– 225 KB

Differences between In diffusion through InAs/AIAs and InAs/GaAs interfaces have been studied by X-ray diffraction in two crystals grown on \(\mathrm{GaAs}(001)\) substrates by atomic layer molecular beam epitaxy. The two samples were designed to include one InAs layer into an AlAs/GaAs superlattice