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Electron diffraction and lattice image simulations with the inclusion of HOLZ reflections

✍ Scribed by L.C. Qin; K. Urban


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
712 KB
Volume
33
Category
Article
ISSN
0304-3991

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The heights of ledges on 0' plates in Al-4 wt"/, Cu annealed for 90 min at 275Β°C after a solution treatment for 24 h at 540Β°C have been determined by convergent beam electron diffraction and lattice plane imaging. Ledges with smaller heights (between 0.29 and 2 nm) than those found by Weatherly and