Determination of the heights of ledges o
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Y Bouazra; F Reynaud
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Article
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1984
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Elsevier Science
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The heights of ledges on 0' plates in Al-4 wt"/, Cu annealed for 90 min at 275Β°C after a solution treatment for 24 h at 540Β°C have been determined by convergent beam electron diffraction and lattice plane imaging. Ledges with smaller heights (between 0.29 and 2 nm) than those found by Weatherly and