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Absolute Pressure Derivatives of Deep Level Defects in III-V Semiconductors

✍ Scribed by Nolte, D. D.; Walukiewicz, W.; Hailer, E. E.

Book ID: 118184140
Publisher: Cambridge University Press
Year: 1987
Weight: 353 KB
Volume: 104
Category: Article
ISSN: 0272-9172
DOI: 10.1557/proc-104-423

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