About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Power Issues During Test

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 975 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Test of Power Management Structures

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 839 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Low-Power Design Techniques and Test Implications

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 872 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Fundamentals of VLSI Testing

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 819 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Test Strategies for Gated Clock Designs

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 676 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

[IEEE 2006 Design, Automation and Test i

[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Circuit-aware Device Design Methodology for Nanometer Technologies: A Case Study for Low Power SRAM Design

✍ Qikai Chen, ; Mukhopadhyay, S.; Bansal, A.; Roy, K. 📂 Article 📅 2006 🏛 IEEE 🌐 German ⚖ 322 KB