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[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Circuit-aware Device Design Methodology for Nanometer Technologies: A Case Study for Low Power SRAM Design

✍ Scribed by Qikai Chen, ; Mukhopadhyay, S.; Bansal, A.; Roy, K.

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