[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Exploring “ temperature-aware ” design in low-power MPSoCs

[IEEE 2006 Design, Automation and Test i

✍ Jing Huang, ; Momenzadeh, M.; Lombardi, F. 📂 Article 📅 2006 🏛 IEEE 🌐 German ⚖ 535 KB

[IEEE 2006 Design, Automation and Test i

✍ Qikai Chen, ; Mukhopadhyay, S.; Bansal, A.; Roy, K. 📂 Article 📅 2006 🏛 IEEE 🌐 German ⚖ 322 KB

[IEEE 2006 Design, Automation and Test i

✍ Yang Liu, ; Bouganis, C.-S.; Cheung, P.Y.K.; Leong, P.H.W.; Motley, S.J. 📂 Article 📅 2006 🏛 IEEE 🌐 German ⚖ 236 KB

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✍ Balachandran, J.; Brebels, S.; Carchon, G.; Webers, T.; De Raedt, W.; Nauwelaers 📂 Article 📅 2006 🏛 IEEE 🌐 German ⚖ 517 KB

[IEEE 2006 Design, Automation and Test i

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[IEEE 2006 Design, Automation and Test i

✍ Hosseinabady, M.; Banaiyan, A.; Bojnordi, M.N.; Navabi, Z. 📂 Article 📅 2006 🏛 IEEE 🌐 German ⚖ 267 KB

[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Exploring &#8220; temperature-aware &#8221; design in low-power MPSoCs