Power-Aware Testing and Test Strategies for Low Power Devices || Fundamentals of VLSI Testing

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Power Issues During Test

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 975 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Test of Power Management Structures

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 839 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Low-Power Design Techniques and Test Implications

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 872 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Test Strategies for Gated Clock Designs

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 676 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Survey of low-power testing of VLSI circ

Survey of low-power testing of VLSI circuits

✍ Girard, P. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 262 KB

Design and testing of fast, low-power, l

Design and testing of fast, low-power, low-noise amplifier-comparator VLSI circuits

✍ Wladyslaw Dabrowski; Hartmut F.-W. Sadrozinski; Joel DeWitt 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 544 KB

Power-Aware Testing and Test Strategies for Low Power Devices || Fundamentals of VLSI Testing

✦ Synopsis