✦ LIBER ✦

Survey of low-power testing of VLSI circuits

✍ Scribed by Girard, P.

Book ID: 118028285
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 262 KB
Volume: 19
Category: Article
ISSN: 0740-7475
DOI: 10.1109/mdt.2002.1003802

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