Power-Aware Testing and Test Strategies for Low Power Devices || Test of Power Management Structures

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Power Issues During Test

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 975 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Low-Power Design Techniques and Test Implications

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 872 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Fundamentals of VLSI Testing

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 819 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Power-Aware Testing and Test Strategies

Power-Aware Testing and Test Strategies for Low Power Devices || Test Strategies for Gated Clock Designs

✍ Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing 📂 Article 📅 2009 🏛 Springer US 🌐 English ⚖ 676 KB

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati

Multidimensional Adaptive Power Manageme

Multidimensional Adaptive Power Management for Low-Power Operation of Wireless Devices

✍ Senguttuvan, R.; Sen, S.; Chatterjee, A. 📂 Article 📅 2008 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 558 KB

A New Scan Architecture for Both Low Pow

A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment

✍ Hong-Sik Kim; Sungho Kang; Michael S. Hsiao 📂 Article 📅 2008 🏛 Springer US 🌐 English ⚖ 490 KB

Power-Aware Testing and Test Strategies for Low Power Devices || Test of Power Management Structures

✦ Synopsis