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A technique to measure trap characteristics in CCD's using X-rays

✍ Scribed by Gendreau, K.C.; Prigozhin, G.Y.; Huang, R.K.; Bautz, M.W.


Book ID
114536323
Publisher
IEEE
Year
1995
Tongue
English
Weight
484 KB
Volume
42
Category
Article
ISSN
0018-9383

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