A novel scheme to measure the interface trap density near band edges using CCD's

✍ Scribed by Carter, D.L.

• Book ID: 114595163
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 127 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22064