A novel scheme to measure the interface trap density near band edges using CCD's

✍ Scribed by Madan, S.K.; Bhaumik, B.

• Book ID: 114594892
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 283 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1984.21742