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X-ray polarimetry and position measurement using the photoeffect and charge diffusion in a CCD

✍ Scribed by K.H. Schmidt; M. Bögner; G. Buschhorn; R. Kotthaus; R. Oberhuber; M. Rzepka

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
422 KB
Volume
367
Category
Article
ISSN
0168-9002

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