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A technique for preparing samples of metal nanowires for electron and atomic-force microscopy

โœ Scribed by V. F. Reutov; M. F. Miklyaev; B. V. Mchedlishvili

Book ID
110167444
Publisher
Springer
Year
2007
Tongue
English
Weight
331 KB
Volume
50
Category
Article
ISSN
0020-4412

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## Abstract Two alternative pretreatment methods for depositing metal nanoparticles on mica for atomic force microscopy (AFM) imaging are presented. The treated substrates are flat and clean, thus they are amenable of use to characterize very small nanoparticles. The methods do not require any inst