Sample preparation for the quick sizing of metal nanoparticles by atomic force microscopy

✍ Scribed by Alessandra Vinelli; Elisabetta Primiceri; Marco Brucale; Giampaolo Zuccheri; Ross Rinaldi; Bruno Samorì

• Publisher: John Wiley and Sons
• Year: 2008
• Tongue: English
• Weight: 305 KB
• Volume: 71
• Category: Article
• ISSN: 1059-910X
• DOI: 10.1002/jemt.20631

✦ Synopsis

Abstract

Two alternative pretreatment methods for depositing metal nanoparticles on mica for atomic force microscopy (AFM) imaging are presented. The treated substrates are flat and clean, thus they are amenable of use to characterize very small nanoparticles. The methods do not require any instrumentation or particular expertise. As they are also very quick, the need for storage of the prepared substrates is avoided altogether. These proposed methods, which are compared with the results of transmission electron microscopy analysis, allow the quick sizing and characterization of nanoparticles with the atomic force microscope and could thus help expanding the user community of nanoparticle researchers who could use the AFM for their characterization needs. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.