๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A sub-micron photoluminescence system for nanostructure characterization

โœ Scribed by M. De Vittorio; C. Turco; R. Rinaldi; A. Melcarne; R. Cingolani


Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
561 KB
Volume
53
Category
Article
ISSN
0167-9317

No coin nor oath required. For personal study only.

โœฆ Synopsis


We have developed a local probe technique in order to investigate single quantum confined nanostructures. In our p-photoluminescence (~t-PL) setup the laser probe is focused on the sample surface by a long working distance microscope objective and the photoluminescence of the sample is collected in backscattering mode by the same objective. Both the optical laser pump and the collected signal are fiber optic coupled, in order to increase the flexibility of the system. A wide range of temperatures (25K-300K) is achieved by means of a closed cycle He-cryostat, modified in order to damp mechanical vibrations and to avoid spatial resolution losses. Photoluminescence maps are provided by a motorized X-Y translation stage, that scans the microscope objective over the sample surface. The overall resolution of the system is of about 600 nm, including the laser focused spot size (k=514 nm), the cryostat vibrations and the motorized stage resolution. A few selected ~t-PL experiments on quantum wires (QWR) and quantum dots (QD) are presented and discussed.


๐Ÿ“œ SIMILAR VOLUMES


A sub-micron BiCMOS technology for telec
โœ R. Hadaway; P. Kempf; P. Schvan; M. Rowlandson; V. Ho; J. Kolk; B. Tait; D. Suth ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 216 KB
Development of a microtomography system
โœ M. Wegdรฉn; M. Elfman; P. Kristiansson; N. Arteaga Marrero; V. Auzelyte; K.G. Mal ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 261 KB

A system for ion beam tomography has been implemented in conjunction with the new sub-micron beamline at the Lund Nuclear Microprobe laboratory. The first version of the system is dedicated to STIM (scanning transmission ion microscopy) tomography for three-dimensional mass density analysis, but fut

Deep sub-micron FD-SOI for front-end app
โœ H. Ikeda; Y. Arai; K. Hara; H. Hayakawa; K. Hirose; Y. Ikegami; H. Ishino; Y. Ka ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 213 KB

In order to confirm benefits of a deep sub-micron FD-SOI and to identify possible issues concerning front-end circuits with the FD-SOI, we have submitted a small design to Oki Electric Industry Co., Ltd. via the multi-chip project service of VDEC, the University of Tokyo. The initial test results an