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A study on current collapse in AlGaN/GaN HEMTs induced by bias stress

✍ Scribed by Mizutani, T.; Ohno, Y.; Akita, M.; Kishimoto, S.; Maezawa, K.


Book ID
114617211
Publisher
IEEE
Year
2003
Tongue
English
Weight
365 KB
Volume
50
Category
Article
ISSN
0018-9383

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