𝔖 Bobbio Scriptorium
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A structured testability approach for multi-chip modules based on BIST and boundary-scan : Yervant Zorian. IEEE Transactions on Components, Packaging, and Manufacturing Technology—Part B, 17, 3, 283 (August 1994)


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
112 KB
Volume
36
Category
Article
ISSN
0026-2714

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