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Computer vision for automatic inspection of a high density grid of pads on multi-chip modules (MCM-D) : Michael E. Scaman, Laertis Economikos and Julius Lambright. IEEE Transactions on Components, Packaging, and Manufacturing Technology—Part B, 17, 3, 291 (August 1994)


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
90 KB
Volume
36
Category
Article
ISSN
0026-2714

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