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A Single Pulse Charge Pumping Technique for Fast Measurements of Interface States

✍ Scribed by Lin, L.; Zhigang Ji; Jian Fu Zhang; Wei Dong Zhang; Kaczer, B.; De Gendt, S.; Groeseneken, G.


Book ID
114620436
Publisher
IEEE
Year
2011
Tongue
English
Weight
420 KB
Volume
58
Category
Article
ISSN
0018-9383

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