𝔖 Bobbio Scriptorium
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A scanning optical microscope for the inspection of semiconductor materials and devices

✍ Scribed by T. Wilson; J. N. Gannaway; P. Johnson

Book ID
111671363
Publisher
John Wiley and Sons
Year
1980
Tongue
English
Weight
525 KB
Volume
118
Category
Article
ISSN
0022-2720

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An optical beam induced contrast (OBIC) image of a gallium phosphide light emitting diode, produced using radiation of quantum energy less than the material's enery gap, shows sub-surface crystallographic defects which are not imaged with conventional OBIC. These defects show strong correspondence w