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Electrical characterization of semiconductor materials and devices using scanning probe microscopy

✍ Scribed by P. De Wolf; E. Brazel; A. Erickson

Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 326 KB
Volume: 4
Category: Article
ISSN: 1369-8001
DOI: 10.1016/s1369-8001(00)00174-8

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