✦ LIBER ✦

The scanning optical microscope: A powerful tool for failure analysis of electronic devices

✍ Scribed by G.A. Azzini; G. Arman; P. Montangero

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Differential scanning calorimetry: A pow

✍ A. Ghijsels; F.M.T.A.M. Waals 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 445 KB

Automated laser scanning cytometry: A po

✍ Andrea Lisa Holme; Sanjiv Kumar Yadav; Shazib Pervaiz 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 462 KB 👁 1 views

Optimisation of accelerating voltages fo

✍ D.J. Vowles; K.W. Terry; A. van Riessen 📂 Article 📅 1982 🏛 Elsevier Science ⚖ 120 KB

The use of the scanning electron microsc

📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 119 KB

Failure analysis applications of the sca

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 97 KB

The B/E linked scan of the fast atom bom

✍ V. Kováčik; L. K. Pannell; P. Kiováč 📂 Article 📅 1992 🏛 John Wiley and Sons 🌐 English ⚖ 181 KB