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A scalable noise de-embedding technique for on-wafer microwave device characterization

✍ Scribed by Ming-Hsiang Cho, ; Guo-Wei Huan, ; Yueh-Hua Wang, ; Lin-Kun Wu

Book ID: 121229361
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 202 KB
Volume: 15
Category: Article
ISSN: 1531-1309
DOI: 10.1109/LMWC.2005.856685

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