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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - A nonuniform thermal de-embedding approach for cryogenic on-wafer high-frequency noise measurements

✍ Scribed by Delcourt, S.; Dambrine, G.; Bourzgui, N.E.; Lepilliet, S.; Laporte, C.; Fraysse, J.-P.; Maignan, M.

Book ID: 120195927
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 427 KB
Category: Article
ISBN-13: 9780780383319
DOI: 10.1109/MWSYM.2004.1338954

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