✦ LIBER ✦
A calibrated lumped-element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors
✍ Scribed by Tiemeijer, L.F.; Havens, R.J.
- Book ID
- 114617035
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 665 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9383
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