Comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs"

✍ Scribed by Kaija, T.; Heino, P.

• Book ID: 114660549
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 88 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.2006.869701