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A robust integrated multibias parameter-extraction method for MESFET and HEMT models

✍ Scribed by van Niekerk, C.; Meyer, P.; Schreurs, D.M.M.-P.; Winson, P.B.

Book ID
111874986
Publisher
IEEE
Year
2000
Tongue
English
Weight
276 KB
Volume
48
Category
Article
ISSN
0018-9480

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