A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology

✍ Scribed by Benedetti, A. ;Fagherazzi, G. ;Enzo, S. ;Battagliarin, M.

• Book ID: 114500135
• Publisher: International Union of Crystallography
• Year: 1988
• Tongue: English
• Weight: 703 KB
• Volume: 21
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889888006624