A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology

✍ Scribed by Enzo, S. ;Fagherazzi, G. ;Benedetti, A. ;Polizzi, S.

• Book ID: 114500134
• Publisher: International Union of Crystallography
• Year: 1988
• Tongue: English
• Weight: 728 KB
• Volume: 21
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889888006612