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A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology. Erratum

✍ Scribed by Enzo, S. (author);Fagherazzi, G. (author);Benedetti, A. (author);Polizzi, S. (author)

Book ID: 114500222
Publisher: International Union of Crystallography (IUCr)
Year: 1989
Tongue: English
Weight: 90 KB
Volume: 22
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889888014803

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