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A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks

✍ Scribed by Pantoja-Cortés, Juan; Sánchez-Bajo, Florentino; Ortiz, Angel L


Book ID
111898263
Publisher
Institute of Physics
Year
2012
Tongue
English
Weight
634 KB
Volume
24
Category
Article
ISSN
0953-8984

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